19.07.2011, 305 days ago

InVar 2.1 introduces analog EM and reliability analysis


Electromigration and Reliability analysis is available as immediate and free update for the current customers of InVar Analog (tm).

Analog EM solution complements existing digital EM solution of InVar Digital (tm).

New analysis functionality provides detailed per-rectangle reports for:

  • Current density
  • jmax_dc_(avg/rms/peak)
  • jmax_ac_(avg/rms/peak)
  • Lifetime

in signal and supply wires.


←